Introduction To Mixed-Signal Test and Measurement
Résumé
Contents
- Chapter 1: Overview of Mixed-Signal Testing
- 1.1 Mixed-Signal Ciruits
- 1.2 Why Test Mixed-Signal Devices
- 1.3 Post-Silicon Production Flow
- 1.4 Test and Diagnostic Equipment
- 1.5 New Product Development
- 1.6 Mixed-Signal Testing Challenges
- Chapter 2: The Test Specification Process
- 2.1 Device Data Sheets
- 2.2 Generating the Test Plan
- 2.3 Components of a Test Program
- 2.4 Summary
- Chapter 3: DC and Parametric Measurements
- 3.1 Continuity
- 3.2 Leakage Currents
- 3.3 Power Supply Currents
- 3.4 DC References and Regulators
- 3.5 Impedance Measurements
- 3.6 DC Offset Measurements
- 3.7 DC Gain Measurements
- 3.8 DC Power Supply Rejection Ratio
- 3.9 DC Common Mode Rejection Ratio
- 3.10 Comparator DC Tests
- 3.11 Voltage Search Techniques
- 3.12 DC Tests for Digital Circuits
- 3.13 Summary
- Chapter 4: Measurement Accuracy
- 4.1 Terminology
- 4.2 Calibrations and Checkers
- 4.3 Dealing with Measurement Error
- 4.4 Basic Data Analysis
- 4.5 Summary
- Chapter 5: Tester Hardware
- 5.1 Mixed-Signal Tester Overview
- 5.2 DC Resources
- 5.3 Digital Subsystem
- 5.4 AC Source and Measurement
- 5.5 Time Measurement System
- 5.6 Computing Hardware
- 5.7 Summary
- Chapter 6: Sampling Theory
- 6.1 Analog Measurements Using DSP
- 6.2 Sampling and Reconstruction
- 6.3 Repetitive Sample Sets
- 6.4 Synchronization of Sampling Systems
- 6.5 Summary
- Chapter 7: DSP-Based Testing
- 7.1 Advantages of DSP-Based Testing
- 7.2 Digital Signal Processing
- 7.3 Discrete-Time Transforms
- 7.4 The Inverse FFT
- 7.5 Summary
- Chapter 8: Analog Channel Testing
- 8.1 Overview
- 8.2 Gain and Level Tests
- 8.3 Phase Tests
- 8.4 Distortion Tests
- 8.5 Signal Rejection Tests
- 8.6 Noise Tests
- 8.7 Simulation of Analog Channel Tests
- 8.8 Summary
- Chapter 9: Sampled Channel Testing
- 9.1 Overview
- 9.2 Sampling Considerations
- 9.3 Encoding and Decoding
- 9.4 Sampled Channel Tests
- 9.5 Summary
- Chapter 10: Focused Calibrations
- 10.1 Overview
- 10.2 DC Calibrations
- 10.3 AC Amplitude Calibrations
- 10.4 Other AC Calibrations
- 10.5 Error Cancellation Techniques
- 10.6 Summary
- Chapter 11: DAC Testing
- 11.1 Basics of Converter Testing
- 11.2 Basic DC Tests
- 11.3 Transfer Curve Tests
- 11.4 Dynamic DAC Tests
- 11.5 DAC Architectures
- 11.6 Summary
- Chapter 12: ADC Testing
- 12.1 ADC Testing Versus DAC Testing
- 12.2 ADC Code Edge Measurements
- 12.3 DC Tests and Transfer Curve Tests
- 12.4 Dynamic ADC Tests
- 12.5 ADC Architectures
- 12.6 Tests for Common ADC Applications
- 12.7 Summary
- Chapter 13: DIB Design
- 13.1 DIB Basics
- 13.2 Printed Circuit Boards (PCBS)
- 13.3 DIB Traces, Shields, and Guards
- 13.4 Transmission Lines
- 13.5 Grounding and Power Distribution
- 13.6 DIB Components
- 13.7 Common DIB Circuits
- 13.8 Common DIB Mistakes
- 13.9 Summary
- Chapter 14: Design for Test (DfT)
- 14.1 Overview
- 14.2 Advantages of DfT
- 14.3 Digital Scan
- 14.4 Digital BIST
- 14.5 Digital DfT for Mixed-Signal Circuits
- 14.6 Mixed-Signal Boundary Scan and BIST
- 14.7 Ad Hoc Mixed-Signal DfT
- 14.8 Subtle Forms of Analog DFT
- 14.9 IDDQ
- 14.10 Summary
- Chapter 15: Data Analysis
- 15.1 Introduction to Data Analysis
- 15.2 Data Visualization Tools
- 15.3 Statistical Analysis
- 15.4 Statistical Process Control (SPC)
- 15.5 Summary
- Chapter 16: Test Economics
- 16.1 Profitability Factors
- 16.2 Direct Testing Costs
- 16.3 Debugging Skills
- 16.4 Emerging Trends
- 16.5 Summary
L'auteur - Marks Burns
Texas Instruments
L'auteur - Gordon Roberts
Department of Electrical Engineering, McGill
University
Caractéristiques techniques
PAPIER | |
Éditeur(s) | Oxford University Press |
Auteur(s) | Marks Burns, Gordon Roberts |
Parution | 01/05/2001 |
Nb. de pages | 684 |
Format | 19,5 x 24,3 |
Couverture | Relié |
Poids | 1357g |
Intérieur | Noir et Blanc |
EAN13 | 9780195140163 |
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