CMOS Electronics

How it Works, How it Fails

Jaume Segura, Charles F. Hawkins

348 pages, parution le 05/05/2004

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Résumé

Get a better understanding of how CMOS circuits work and, more importantly, how they fail! CMOS manufacturing environments are rife with symptoms that can indicate serious test, design, or reliability problems. CMOS Electronics: How It Works, How It Fails provides both practitioners and students in the industry with the electronic knowledge that relates not just to the design of a product, but other important aspects of manufacturing such as testing, reliability, failure analysis, yield-quality issues, and common problems that may occur during production.

The majority of those who work in the CMOS integrated circuit (IC) industry have educational backgrounds other than electrical engineering. The first part of the book assumes little knowledge of circuitry and transistors, covering the relevant basic electronics of CMOS ICs at a tutorial level or as a quick review for electrical engineers. The second half offers thorough descriptions of failure mechanisms that both audiences can appreciate. A valuable addition to the CMOS literature, CMOS Electronics addresses such common questions as:

Is the symptom an outcome of random defects, or is it symptomatic with a common failure signature?
Why doesn't my test program detect certain defects?
Are my test escapes a reliability problem?
Is the defect a bridging problem, an open circuit problem, or a subtle speed-related problem?

Providing rapid guidance to the nature of these problems and offering unique descriptions of many circuit failure mechanisms found previously only in research papers, CMOS Electronics is an essential text for practitioners in the CMOS industry, or students headed there.

L'auteur - Jaume Segura

Jaume Segura, PhD, is an Associate Professor of Electrical Engineering at the Balearic Islands University, Spain, where he has been a member of the faculty since 1993. He has been a visiting researcher at Philips Semiconductors and Intel Corporation, working on design and test issues. He is a member of the IEEE, the Chairman of the IEEE-CAS Spanish Chapter, and serves on the technical program committees of such conferences as ITC, DATE, and VTS.

L'auteur - Charles F. Hawkins

Charles F. Hawkins, PhD, is a Professor of Electrical Engineering at the University of New Mexico at Albuquerque, where he has been a member of the faculty since 1972. He is also a research contract engineer with the Sandia National Laboratories IC Group and has consulted with Intel Corporation, AMD Corporation, and Philips Research Labs on issues of quality, reliability, testability research, and testing. Professor Hawkins is a Member of IEEE and a member of the Electronic Device Failure Analysis Society (EDFAS) of ASM, as well as the editor of EDFAS Magazine. Professor Hawkins frequently teaches short courses and industrial seminars to leading chip manufacturers worldwide.

Sommaire

CMOS Fundamentals
Electrical Circuit Analysis
Semiconductor Physics
MOSFET Transistors
CMOS Basic Gates
CMOS Basic Circuits
Failure Modes, Defects, and Testing of CMOS Ics
Failure Mechanism in CMOS IC Materials
Bridging Defects
Open Defects
Parametric Failures
Defect-Based Testing
A. Solutions to Self-Exercises

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Caractéristiques techniques

	PAPIER
Éditeur(s)	Wiley
Auteur(s)	Jaume Segura, Charles F. Hawkins
Parution	05/05/2004
Nb. de pages	348
Format	18 x 26
Couverture	Relié
Poids	840g
Intérieur	Noir et Blanc
EAN13	9780471476696