Introduction to diffraction in materials science and engineering
Résumé
Designed as a teaching and self-study text, this resource begins with a treatment of the fundamentals of crystallography and crystal structure and its importance in diffraction before moving on to cover important aspects of diffraction applications. Numerous examples and problems at the end of each chapter, including critical thinking questions, make this an excellent tool for learning and understanding. The book includes treatments of:
o Basics of crystallography
o Geometrical representation of crystals and reciprocal space
o X-rays and neutrons
o Structure factors and intensity
o Powder diffraction
o Qualitative (Powder Diffraction File) and quantitative phase analysis
o Use of the International Tables for more complex structures and the Reitveld method
o Residual stress
Introductions to texture, small diffracting units, and long-range order
Contents
- Preface
- Crystallography
- Geometrical Representation of Crystals
- X-Rays
- Neutrons
- Diffraction
- Diffraction Peak Intensity and Measurement
- Two-Dimensional Recording Methods
- Phase Analysis
- Diffraction from More Complex Structures
- Stress Analysis
- Other Kinds of Materials Characterization Using Diffractio
- Appendixes
Caractéristiques techniques
| PAPIER | |
| Éditeur(s) | Wiley |
| Auteur(s) | Aaron Krawitz |
| Parution | 01/04/2001 |
| Nb. de pages | 407 |
| Format | 15,8 x 24 |
| Couverture | Relié |
| Poids | 714g |
| Intérieur | Noir et Blanc |
| EAN13 | 9780471247241 |
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